Process NodeMEDIUMDEMOEstimated
SMIC Reports N+2 Node Ramp Constrained by DUV Multi-Patterning Complexity
SMIC's most advanced N+2 (~7nm-class) process uses complex DUV multi-patterning in the absence of EUV lithography. Yield improvement and capacity expansion are progressing but constrained by lithography limitations imposed by US export controls. [DEMO est.]
SMIC Earnings / Industry Analysis — DEMO est.MED2024-08-09
China
SMIC